The study of neutron induced upsets was extended to avionics altitudes by Tabor and Normand. The burst generation rate (BGR) approach was developed by Ziegler and Lanford to calculate single event upset (SEU) rate induced by protons or neutrons. The key part of the method is the BGR function, which expresses the probability that an incident particle will produce recoil particles of appropriate energies. The IBM group made an extensive study of upsets at ground level. In many situations, the author examines single event effect (SEE) in nonmemory parts such as controllers, microprocessors, or FPGAs. In these cases we obtain a cross section per device, which is some unknown number times the cross section per bit. In these cases we can calculate the FOM per device using the cross section per device. The SEE rate per device is calculated using the same orbit‐specific rate coefficient.

    avionics; microprocessors; neutron effects


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Neutron Induced Upset


    Contributors:

    Published in:

    Publication date :

    2011-09-20


    Size :

    8 pages




    Type of media :

    Article/Chapter (Book)


    Type of material :

    Electronic Resource


    Language :

    English




    UPSET APPARATUS FOR UPSET FLOOD GATE

    European Patent Office | 2021

    Free access

    Upset blades

    Engineering Index Backfile | 1952


    Airplane Upset Recovery

    Carbaugh, D. / Flight Safety Foundation / International Federation of Airworthiness et al. | British Library Conference Proceedings | 1998


    Airplane Upset Recovery

    Forsythe, D. / Flight Safety Foundation | British Library Conference Proceedings | 1998


    Airplane Upset Recovery

    Forsythe, D. / Flight Safety Foundation | British Library Conference Proceedings | 1998