The study of neutron induced upsets was extended to avionics altitudes by Tabor and Normand. The burst generation rate (BGR) approach was developed by Ziegler and Lanford to calculate single event upset (SEU) rate induced by protons or neutrons. The key part of the method is the BGR function, which expresses the probability that an incident particle will produce recoil particles of appropriate energies. The IBM group made an extensive study of upsets at ground level. In many situations, the author examines single event effect (SEE) in nonmemory parts such as controllers, microprocessors, or FPGAs. In these cases we obtain a cross section per device, which is some unknown number times the cross section per bit. In these cases we can calculate the FOM per device using the cross section per device. The SEE rate per device is calculated using the same orbit‐specific rate coefficient.

    avionics; microprocessors; neutron effects


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    Titel :

    Neutron Induced Upset


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    2011-09-20


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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