Two developments in microelectronics have the potential to significantly change the way weapon systems are supported. They are the development of buses to be used for control and data information flow between subsystem maintenance controllers, module maintenance controllers, and individual elements (chips) of a module; and the inclusion of testable building blocks in CAD databases along with rules that govern their use. When applied to weapon-systems design, these two concepts can be combined to give an onboard hierarchical maintenance and diagnostic capability that could significantly change weapon-system support concepts. The author discusses these concepts and their relation to weapon-system support and future automatic test systems.
VHSIC interoperability standards and design for test rules: their impact on weapon system support concepts
Durchfuehrbare Standards und Pruefregeln fuer VHSIC-Schaltungen und ihr Einfluss auf Waffensysteme
1987
5 Seiten, 11 Quellen
Conference paper
English
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