The use of Plastic Encapsulated Microcircuits (PEMs) in space flight applications is becoming an increasingly important issue. PEMs are reputed to offer significant cost, availability, size and weight advantages over the hermetic devices in many space applications. On the other hand, PEM opponents maintain that, despite marked improvements in PEM construction techniques and in associated reliability data, there still is insufficient high reliability data to support their use. Currently, there are no standard PEM processing, test, and qualification requirements which can be confidently used for space-level procurement. It is recognized that some JEDEC standards, covering test methods and procedures for PEMs, have recently been released by the Electronics Industry Association (EIA) and others have been proposed. It is also recognized that MIL-PRF-38535 has identified the necessary criteria to allow a PEM manufacturer to be included in the Qualified Manufacturers Listing (QML) and that some candidate QML PEM manufacturers have already been audited. However, the fact remains that space community has not adopted any standards for PEMs; nor has it identified any requirements for PEMs to be used in space applications. The critical issues related to use of PEMs for space flight applications are presented.


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    Title :

    Critical issues for reliable applications of plastic encapsulated microcircuits in spaceflight applications


    Additional title:

    Kritische Zuverlässigkeitsprobleme beim Einsatz von kunststoffgekapselten Mikroschaltkreisen in der Raumfahrt


    Contributors:
    Virmani, N. (author)


    Publication date :

    1996


    Size :

    9 Seiten, 3 Bilder, 3 Tabellen, 7 Quellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English