Operating principles and hardness assurance methods are discussed for various types of optocouplers. Radiation damage in light-emitting diodes is addressed, along with the impact of phototransistors and internal amplifiers on overall performance. Hardness assurance for optocouplers is contrasted with the approach used for conventional microelectronics. Methods of detecting abnormal devices are discussed, along with the implementation of special screening measurements.


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    Title :

    Optocouplers: fundamentals and hardness assurance for space applications


    Contributors:

    Published in:

    Publication date :

    2009


    Size :

    8 Seiten, 19 Quellen




    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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