This paper presents an advanced concurrent EMC (electromagnetic compatibility) simulation process that incorporates the EMC behavior of the electronic equipment in the system-level automotive EMC simulation. The major improvement of the proposed analysis strategy is a new model description technique of active integrated circuit devices, which is based on the hardware description language VHDL-AMS, and an appropriate extension of the conventional analysis technique. The whole EMC simulation process helps to identify and reject potential EMC problems introduced by new technologies. This cuts the risk of EMC failure and avoids costly and time consuming redesign cycles. The functionality of the presented modeling and analysis flow are shown by means of numerical results from a typical automotive application. The gain in simulation accuracy is demonstrated with a side-by-side comparison of the newly developed VHDL-AMS modeling technique with the conventional IBIS-based approach.


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    Title :

    An advanced continuous multi-level EMC simulation process for automotive applications


    Contributors:


    Publication date :

    2009


    Size :

    9 Seiten, 4 Bilder, 14 Quellen


    Remarks:

    (nicht paginiert)



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





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