Embedded power converter used in ground applications and aeronautics must ensure rigorous reliability specifications for human safety reasons as well as economical reasons. This paper concerns a work aiming for reliability quantification of power semiconductor devices, which are strategic parts of power converter. Using traditional and innovating characterization methods, the paper will focus on the devices gate oxide evolution. This evolution may provide operating age indicators.


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    Title :

    Etude de l'evolution de l'oxyde de grille des composants de puissance


    Additional title:

    Untersuchungen der Alterungsvorgänge an Oxidschichten auf metallischen Elektroden in IGBT-Leistungstransistoren


    Contributors:


    Publication date :

    2009


    Size :

    4 Seiten, 5 Bilder, 6 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    French




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