The selection and application of microelectronic components in high reliability space systems requires knowledge of the component design, fabrication process, and applicable tests. In addition, reliability analysis and detailed knowledge of the application environment is necessary in order to determine the suitability of the selected component for the application. These issues are of particular importance for the application of semiconductor devices in high reliability systems due to the need for the utilization of large numbers of these devices at the upper limit of their performance and stress capabilities. In order to collect the reliability and characterization data required for space qualification, an in-depth understanding of the material characteristics, fabrication processes, and relevant failure mechanisms of the technology is necessary. This presentation provides a description of the technical and programmatic challenges affecting the insertion of advanced microelectronics in NASA/JPL flight applications and the methodology necessary to ensure the desired reliability.


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    Title :

    Microelectronics for space applications - challenges and opportunities


    Contributors:
    Kayali, S. (author)


    Publication date :

    2007


    Size :

    1 Seite



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





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