A new result about the reliability models of reconfigurable digital systems is derived and then applied to the problem of establishing ultra reliability by fault injection experiments. The result shows that the complicated fault recovery procedure can be adequately described by a few parameters. The resulting reduction in modeling and experimental effort brings establishing extremely low probabilities of failure within experimental reach. There is a discussion of the differences between this approach and previous efforts. The result is used to design experiments for several example systems.
Fault injection for semiparametric reliability models
IEEE Aerospace Conference, 2005 ; 537-556
2005
20 Seiten, 61 Quellen
Conference paper
English
Fault Injection for Semi-Parametric Reliability Models
British Library Conference Proceedings | 2005
|Designing fault-injection experiments for the reliability of embedded systems
IEEE | 2012
|