SMH AUTOMOBILE has developed a new model to validate the reliability and the useful life of power-IGBTs used with different stresses in the inverters of hybrid and electric vehicles. As for IGBT-modules in the railway traction inverters, for automotive electrical traction system the major failure mechanisms have been identified in the packaging as crack growth in wire bond contacts and thermal fatigue of solder joints. Depending on reliability requirements these mechanisms can be activated using short power cycling tests for bond contact degradation, long power cycling tests and passive temperature cycling tests for the thermal fatigue of solder joints. These tests are generally performed separately in order to achieve reasonable test times for applications with a duty time longer than 1 year. Due to the comparatively short useful life (around 4000 h) of IGBTs in automotive traction inverters, a separation or acceleration of stresses is not necessary. Therefore current profile tests inducing the real stress during the whole duty time are used for validation. Current profile tests are based on typical driving speed cycles (urban, suburban, mixed, highway and mountain). Here the current flowing through the IGBT is simulated according to an accurate model of car's dynamic behaviour and of the electric motors. Based on these different models roughly presented in this paper such as vehicle dynamics and regulation, electrical parameters of E-motors, power losses and thermal behaviour of the IGBT, the junction temperature Tj and an histogram of delta Tj can be drawn, allowing us to get effective results for predicting reliability of power electronics devices. For the automotive applications and once validated by some real measurements established on our vehicle test benches and on current profile simulation test bench at the EMPA, this method has been applied for the choice of components among low cost standard modules.


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    Title :

    Power electronic's reliability in electric vehicles: simulations and tests according to road profiles


    Additional title:

    Verfügbarkeit der Leistungselektronik im Elektrofahrzeug: Simulation und Prüfung mit nachgebildeten Fahrwegprofilen


    Contributors:
    Chave, J. (author) / Kayal, A.H. (author) / Lisowski, L. (author) / Theurillat, P. (author)


    Publication date :

    2000


    Size :

    12 Seiten, 14 Bilder, 1 Tabelle, 6 Quellen


    Type of media :

    Conference paper


    Type of material :

    Storage medium


    Language :

    English




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