Presents a reliability assurance program for optical semiconductor devices used in undersea communications system. The results are based on large-scale life tests conducted over a two-year period on 1000 LDs and 620 APDs. Experimental data are analysed with respect to random and wear-out failure modes. Particular attention was paid to gradual degradation in LDs. The performance reliability of LDs and APDs during the service period confirmed that they would be suitable for use in NTT's FS-400M submarine cable system. Principles for selecting LDs with even higher reliability for application in transocean systems are also discussed.


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    Title :

    Reliability assurance for optical semiconductor devices


    Additional title:

    Zuverlaessigkeitssicherung fuer optische Halbleiterelemente


    Contributors:
    Iwane, G. (author) / Nakano, Y. (author) / Sudo, H. (author)


    Publication date :

    1985


    Size :

    9 Seiten, 15 Quellen


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English





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