Two RF conducted noise measurement systems have been developed for laboratory measurement of automotive electrical and electronic devices. One measures a histogram of noise level. The other measures the susceptibility level of electronic devices to the noise and identifies a malfunction mode. Applicable to frequencies from 150 kHz-60 MHz, the systems are for laboratory use with systems connected to a network representing networks used in Japanese compact passenger vehicles.


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    Title :

    RF conducted noise measurements of automotive electrical and electronic devices using artificial network


    Additional title:

    Hochfrequente Rauschmessungen von elektrischen und elektronischen Bauelementen in Fahrzeugen in einem kuenstlichen Verkehrsnetz


    Contributors:
    Yamamoto, S. (author) / Ozeki, O. (author)

    Published in:

    Publication date :

    1983


    Size :

    7 Seiten, 11 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English





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