Rome Air Development Center (RADC) maintains a quick reaction failure analysis laboratory for direct reliability support of Air Force and DoD equipment and systems on a priority basis. Its mission is the analysis of semiconductor device failures in production and field equipment, the identification of contributing failure mechanisms, the recommendation of corrective actions and the execution of system fixes on a quick reaction basis. The technological base for the RADC failure analysis expertise is derived from in-house and contractual device reliability R&D programs, experienced technical personnel, extensive analytical facilities, an existing corporate memory and continuous involvement in diverse system support projects.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Military microcircuits: failure analysis at RADC


    Additional title:

    Militaerische Mikroschaltungen: Fehleranalyse durch RADC


    Contributors:

    Published in:

    Publication date :

    1979


    Size :

    5 Seiten


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




    RADC SCAT automated sneak circuit analysis tool

    DePalma, E.L. | Tema Archive | 1990


    RADC Experiences and Experiments in Reliabilty Demonstration

    Coppola, A. / Pettinato, A. D. | IEEE | 1966


    Upscreening of microcircuits for military applications

    Criscimagna, N.H. | Tema Archive | 1999



    NASA Langley and AF RADC high-speed fiber optic transceiver program

    Hendricks, H.D. / Cook, A.L. / Mack, T.L. et al. | Tema Archive | 1990