This paper discusses the problem of identifiying the 'true' BIT (Built-in-test) detectability for weapons. When weapons are returned for maintenance, they are tested for all critical parameters and a 'measured' BIT detectability is found by dividing the number of BIT-detected failures found in the field by all critical failures found on test at the maintenance facility. However, this calculation is subject to error because those weapons with BIT-detected field failures return earlier than those which pass the field BIT. This difference in the return time of weapons is examined in the paper and a methodology and a model are developed to compensate for the time-of-return differences in order to obtain a 'true' BIT detectability factor. The model requires inputs for measured BIT detectability, the interval between field-conducted BITs, the interval between scheduled maintenance checks, and the time since start of deployment. Six sets of curves are provided, comparing true BIT detectability values of 0.4, 0.5, 0.6, 0.7, and 0.8 to BIT detectability values measured under six varying circumstances - three different maintenance periods (12, 24, and 36 months), each with two different BIT schedules (at 3-month and 6-month intervals.)


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    Title :

    Correction for BIT detectability measurement error


    Additional title:

    Auswertung von Fehlererkennungen durch eingebaute Testverfahren in komplexen Waffensystemen


    Contributors:


    Publication date :

    1986


    Size :

    5 Seiten, 8 Bilder, 2 Quellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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