A paper written for AUTOTESTCON '82, 'New Generation ATE Self-Test Concepts', suggested that microprocessor controlled instruments reduce the burden of the station central processor by running 'distributed background self test functions at the instrument level'. Smart instruments would 'have superior capability to detect intermittents, and provide immediate fault isolation to a resource' and that 'some improvements are needed in the ability of an ATE self test to detect and isolate intermittent failures'. The ICA comprehensive Built-In-Test hardware and software provide this improved failure detection and fault isolation. The ICA is a solution to many drawbacks of prior ATE test interfaces. Providing a common control interface and a general purpose UUT interface as well as distributed Built-In-Test and self verification functions will reduce ATE life cycle costs and proliferation of new equipment. Reconfigurability allows the ICA to be used in new test station designs with minimal redesign. Test reliability will increase due to the reduction of intermittent failures while instrument reliability increases due to the high confidence level self test. Less time is spent performing these functions on the test station. The ICA represents a major step into the newest generation of ATE instrumentation.
MATE switching subsystem - a design for reconfigurability and testability
Das modulare automatische Pruefsystem als Untersystem fuer einen Entwurf zur Neukonfiguration und Prueffaehigkeit
1983
4 Seiten, 2 Bilder, 1 Quelle
Conference paper
English
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