Using a gate-level emulation of a typical avionics miniprocessor, fault injection experiments were performed to (1) determine the time-to-detect a fault by comparison-monitoring, (2) forecast a program's ability to detect faults and (3) validate the fault detection coverage of a typical self-test program. To estimate time-to-detect, six programs ranging in complexity from 6 to 147 instructions, were emulated. Each program was executed repetively in the presence of a single stuck-at fault at a gate node or device pin. Detection was assumed to occur whenever the computed outputs differed from the corresponding outputs of the same program executed in a non-faulted processor. Histograms of faults detected versus number of repetitions to detection were tabulated. Using a simple model of fault detection, which was based on an analogy with the selection of balls in an urn, distributions of time-to-detect were computed and compared with those obtained empirically. A self-test program of 2,000 executable instructions was designed expressly for the study. The only requirement imposed on the design was that it should achieve 95 % coverage. The program was executed in the presence of a single stuck-at fault at a gate node in device pin. The proportion of detected faults was tabulated.


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    Title :

    Methodology for measurement of fault latency in a digital avionic miniprocessor


    Additional title:

    Ein Verfahren zur Bestimmung der Fehlerlatenz in einem digitalen Bordrechner


    Contributors:
    McGough, J.G. (author) / Swern, F. (author) / Bavuso, J. (author)


    Publication date :

    1981


    Size :

    14 Seiten, 5 Bilder, 11 Tabellen, 5 Quellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English