Williams, R.E.: Management tools for ATLAS programming (151-159). -- Yang, C.-Y.E.: Automatic generation of functional test pattern for a microcomputer chip (160-166). -- Lowenstein, A.: Recommended improvements for digital automatic test program generation (167-178). -- Miller, G.E.: A systematic approach to test programming (179-185). -- Hart, D.: Understanding and using ATE programming languages (186-196)


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    Title :

    Proc. Automated testing for electron. manufacturing seminar exhibit, June 16-19,1980, Boston, USA; (Testprogram generation)


    Additional title:

    Tagungsberichte des Seminars mit Ausstellung ueber automatisches Pruefen in der Fertigung elektronischer Komponenten, 16.-19. Juni 1980, Boston, USA (Entwickeln von Pruefprogrammen)


    Publication date :

    1980


    Size :

    46 Seiten


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English