Williams, R.E.: Management tools for ATLAS programming (151-159). -- Yang, C.-Y.E.: Automatic generation of functional test pattern for a microcomputer chip (160-166). -- Lowenstein, A.: Recommended improvements for digital automatic test program generation (167-178). -- Miller, G.E.: A systematic approach to test programming (179-185). -- Hart, D.: Understanding and using ATE programming languages (186-196)
Proc. Automated testing for electron. manufacturing seminar exhibit, June 16-19,1980, Boston, USA; (Testprogram generation)
Tagungsberichte des Seminars mit Ausstellung ueber automatisches Pruefen in der Fertigung elektronischer Komponenten, 16.-19. Juni 1980, Boston, USA (Entwickeln von Pruefprogrammen)
1980
46 Seiten
Conference paper
English
Engineering Index Backfile | 1925
Control Solutions' Exhibit Guide to Sensors Expo Boston
British Library Online Contents | 2002