R.F. Miller;K.W. Doversberger: Testing electronic products (1-6). --D.E. Krebs: Quality manufacturing - Key to the future of automotive electronics (1-2). --J.L. Webster;W.F. Henley: Production and automated testing of chrysler's engine control computer (1-5). --S.Totani;M. Okada: Improving reliability of automotive electronics (1-6). --C. Braun: Manufacturing excellence - The challenge of the 1980's (1-4).


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    Title :

    Proc. of convergence 80, 30th annual conf. on the IEEE vehicular technology soc., intern. conf. on transportation electronics, Dewborn USA, Sept. 15-17, 1980 (Sess. electronics manufacturing and reliability issues)


    Additional title:

    30. jaehrliche Konferenz des IEEE ueber Kraftfahrzeug-Technologie und Befoerderungselektronik (Sitzung: Herstellung von Elektronikbauteilen und Zuverlaessigsdisskusion)


    Publication date :

    1980


    Size :

    23 Seiten


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English