To study the electric conduction in polycrystalline thin films a structural model is developed. The potential barriers are assumed to be as large as possible. The barrier consists of the grain boundary region and two adjacent microcrystallite layers which are the result of several mechanisms. It is shown that in polycrystalline films the electrical properties e.g. current density, mobility, resistivity, are exponential functions of the longitudinal electric field. The conclusion is that, if the electrical properties of these films are studied, the quantitative dependence of these properties upon the electric field used in measurements must be known.


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    Title :

    Barrier scattering in polycrystalline thin films of semiconductors


    Additional title:

    Barrierenstreuung in duennen polykristallinen Halbleiterschichten


    Contributors:

    Published in:

    Solid State Electronics ; 19 , 10 ; 894-896


    Publication date :

    1976


    Size :

    3 Seiten, 3 Bilder, 8 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English