When logic is tested on an IC, heat generated by power dissipation causes damage to the semiconductor. The IC’s life will be shortened due to this power waste. Therefore, to extend the life of an integrated circuit (IC), power dissipation must be reduced as much as feasible. Additionally, testing every potential test vector for proper IC operation is a limitation. To lower the power consumption during testing of a circuit under test (CUT), we have devised a bit-swapping linear feedback shift register (BS-LFSR). The BS-LFSR reorders the test vectors by swapping out a bit for its next closest neighbor bit. The vectors’ fault coverage capability is maintained, but the total Hamming distance (THD) is lowered to lower power consumption during the shifting operation.
FPGA Implementation of Vector Reduction Algorithm for LFSR
Smart Innovation, Systems and Technologies
Congress on Control, Robotics, and Mechatronics ; 2024 ; Warangal, India February 03, 2024 - February 04, 2024
Proceedings of the Second Congress on Control, Robotics, and Mechatronics ; Chapter : 15 ; 197-205
2024-11-14
9 pages
Article/Chapter (Book)
Electronic Resource
English
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