Abstract This chapter describes the main space radiation effects in integrated circuits (total dose and single event effects) and experimental approach of their simulation in microelectronic parts. Simulation experimental techniques are presented to obtain the main radiation sensitivity parameters of IC.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Simulation of Space Radiation Effects in Microelectronic Parts

    Nikiforov, A. Y. / Chumakov, A. I. | British Library Conference Proceedings | 2004


    Microelectronic Space Power Supplies

    Hepp, A. F. / Bailey, S. G. / Landis, G. A. et al. | British Library Conference Proceedings | 2002


    Microelectronic space power supplies

    Raffaelle, R.P. / Landis, G.A. / Bailey, S.G. et al. | Tema Archive | 2002


    Microelectronic Chips For Radiation-Dose Tests

    Buehler, Martin G. / Lin, Yu-Sang / Ray, Kevin P. et al. | NTRS | 1993