Time Delay and Integration (TDI) is used to increase the Signal to Noise Ratio (SNR) in image sensors when imaging fast moving objects. One important TDI application is in Earth observation from space. In order to operate in the space radiation environment, the effect that radiation damage has on the performance of the image sensors must be understood. This work looks at prototype TDI sensor pixel designs, produced by e2v technologies. The sensor is a CCD-like charge transfer device, allowing in-pixel charge summation, produced on a CMOS process. The use of a CMOS process allows potential advantages such as lower power consumption, smaller pixels, higher line rate and extra on-chip functionality which can simplify system design. CMOS also allows a dedicated output amplifier per column allowing fewer charge transfers and helping to facilitate higher line rates than CCDs. In this work the effect on the pixels of radiation damage from high energy protons, at doses relevant to a low Earth orbit mission, is presented. This includes the resulting changes in Charge Transfer inefficiency (CTI) and dark signal.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    A CMOS TDI image sensor for Earth observation



    Conference:

    Nanophotonics and Macrophotonics for Space Environments IX ; 2015 ; San Diego,California,United States


    Published in:

    Publication date :

    2015-09-01





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





    Earth Observation

    Becker, F. / European Space Agency | British Library Conference Proceedings | 1996


    ADCS sensor placement on an earth observation satellite

    Ataalp, Kagan / Ozmen, Anil / Akbulut, Burak et al. | IEEE | 2015


    Earth observation

    Goldsmith, P. / Readings, C. J. / European Space Agency et al. | British Library Conference Proceedings | 1994