Temperature variations in the NICMOS detectors arise from a variety of thermal sources. These thermal variations lead to several image artifacts which must be removed before making quantitative scientific measurements from NICMOS data. Future instruments would do well to minimize sources of thermal instabilities in their detectors. A related problem is the inability to directly measure detector temperature from bias due to the instability of the low-voltage power supply in NICMOS. Identifying ways to directly monitor detector temperatures would be an important benefit for future missions.
NICMOS: lessons learned for future space infrared instrumentation
Optical, Infrared, and Millimeter Space Telescopes ; 2004 ; United States
Proc. SPIE ; 5487
2004-10-12
Conference paper
Electronic Resource
English
NICMOS: A Second Generation Infrared Instrument for the Hubble Space Telescope
Online Contents | 1993
|NICMOS: A Second Generation Infrared Instrument for the Hubble Space Telescope
British Library Conference Proceedings | 1993
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