Infrared active-source lock-in techniques are used for a variety of solar cell inspections, including electro- and photoluminescence, carrier density imaging, shunt imaging and physical defects. The principles and power of the lock-in technique are reviewed for these inspection methods. Different camera types, including NIR, MW and LW, are available for the different techniques. A selection of excitation sources--electrical, laser, lamp and mechanical-stimulate different physical phenomena. Measurements are presented of several manufacturing yield limiting parameters, and the advantages and limitations of the techniques are discussed.


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    Title :

    Infrared lock-in techniques for solar cell inspection


    Contributors:

    Conference:

    Thermosense: Thermal Infrared Applications XXXIII ; 2011 ; Orlando,Florida,United States


    Published in:

    Publication date :

    2011-05-06





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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