Infrared active-source lock-in techniques are used for a variety of solar cell inspections, including electro- and photoluminescence, carrier density imaging, shunt imaging and physical defects. The principles and power of the lock-in technique are reviewed for these inspection methods. Different camera types, including NIR, MW and LW, are available for the different techniques. A selection of excitation sources--electrical, laser, lamp and mechanical-stimulate different physical phenomena. Measurements are presented of several manufacturing yield limiting parameters, and the advantages and limitations of the techniques are discussed.
Infrared lock-in techniques for solar cell inspection
Thermosense: Thermal Infrared Applications XXXIII ; 2011 ; Orlando,Florida,United States
Proc. SPIE ; 8013
2011-05-06
Conference paper
Electronic Resource
English
Infrared lock-in techniques for solar cell inspection [8013-20]
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