As the use of electronic devices in automobiles increases, the reliability of such devices is becoming increasingly important. One possible failure is due to leakage resulted from imperfect hermetical seal in mircochips and microelectronic packages. This paper presents an optical technique referred to as shearography for rapid evaluation of hermetics seals. The proposed process of leaking testing is very fast and practical.


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    Title :

    Rapid Evaluation of Hermetic Seals in Automotive Microelectronic Packages Using Shearography


    Additional title:

    Sae Technical Papers


    Contributors:
    Shi, Dahuan (author) / Hung, Y. Y. (author)

    Conference:

    International Congress & Exposition ; 1996



    Publication date :

    1996-02-01




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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