This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.


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    Title :

    TEST DEVICE HEAD CONTACT DURATION ANALYSIS


    Publication date :

    1990-03-01



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English








    Effect of Long-Duration Impact on Head

    Thomas, L M. / Hodgson, V. R. | SAE Technical Papers | 1972