This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
1990-03-01
Conference paper
English
Test Device Head Contact Duration Analysis
SAE Technical Papers | 2011
Test Device Head Contact Duration Analysis
SAE Technical Papers | 2005
Test Device Head Contact Duration Analysis
SAE Technical Papers | 2016
TEST DEVICE HEAD CONTACT DURATION ANALYSIS
SAE Technical Papers | 1997
Effect of Long-Duration Impact on Head
SAE Technical Papers | 1972
|