This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications (the latest revision). The scope of this document is to establish the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.
Qualification and Reliability Monitors
2014-09-12
Conference paper
English
Spacecraft reliability and qualification
NTRS | 1966
|Gemini reliability and qualification experience
NTRS | 1967
|Gemini Reliability and Qualification Experience
NTIS | 1967
|Reliability and qualification activities at ENEA
Automotive engineering | 1988
|Accelerated Reliability Qualification in Automotive Testing
Tema Archive | 2004
|