The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity). Test method has been well understood and used throughout industry as alternative form of transient immunity to understand design margins of a component. No new technology or transient types will be forthcoming in the near future.


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    Title :

    Characterization, Conducted Immunity


    Publication date :

    2018-06-12



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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