The methods included in this document are: a Voltage-Temperature Design Margins. b Voltage Interruptions and Transients. c Voltage Dropouts and Dips. d Current Draw Under a Number of Conditions. e Switch Input Noise These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity). Test method has been well understood and used throughout industry as alternative form of transient immunity to understand design margins of a component. No new technology or transient types will be forthcoming in the near future.
Characterization, Conducted Immunity
2018-06-12
Conference paper
English
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