The increase in complexity of test and measurement procedures for automobile testing in garage environments has necessitated a new look at the connection techniques between the test equipment and automobile. This paper focuses on the design methods and design verification test strategies used to manufacture reliable adapter assemblies that withstand high life cycle* and hostile field environments. Technical constraints are becoming more stringent and design considerations more complex (such as space limitations, current carrying requirements, material selection, ergonomics, and cost).


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Developing High Life Cycle Connectors for Field Automotive Testing


    Additional title:

    Sae Technical Papers


    Contributors:

    Conference:

    International Congress & Exposition ; 1993



    Publication date :

    1993-03-01




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    Developing high life cycle connectors for field automotive testing

    Blanco,J.A. / Hewlett Packard,US | Automotive engineering | 1993


    Automotive connectors

    Tanner, P. N. / Institution of Electrical Engineers; Computing and Control; Professional Group C12 (Transport Electronics and Control) | British Library Conference Proceedings | 1993


    Durability testing of IDC connectors for automotive applications

    Hayes,E.J. / AMP,FR | Automotive engineering | 1992


    Durability Testing of IDC Connectors for Automotive Applications

    Hayes, Earl J. | SAE Technical Papers | 1992