Increasing complexity of electronic instrumentation products has emphasized the need for diagnostic capability to be an integral part of product design. Diagnostic requirements differ for the development, manufacturing, and service phases of the product life. In addition, design flexibility, cost effectiveness, time effectiveness, and compatibility with other products must be studied prior to selecting a diagnostic approach. Two diagnostic strategies (internal and external) are discussed and compared.


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    Title :

    Diagnostic Strategies for Electronic Instrument Clusters


    Additional title:

    Sae Technical Papers


    Contributors:

    Conference:

    SAE International Congress and Exposition ; 1987



    Publication date :

    1987-02-01




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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