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    Title :

    Membrane degradation mechanism during open-circuit voltage hold test



    Published in:

    Publication date :

    2008



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English



    Classification :

    Local classification TIB:    645/5625
    BKL:    52.57 Energiespeicherung / 53.36 Energiedirektumwandler, elektrische Energiespeicher



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