Characterizing SOI Wafers by Use of AOTF-PHI
NASA tech briefs ; 19 , 6
1995
Article (Journal)
English
Characterizing SOI Wafers By Use Of AOTF-PHI
NTRS | 1995
|Demonstration AOTF Imaging Spectrometer
NTRS | 1993
|Schnelle Erkennung von Kunststoffen mit AOTF-Reflektionsspektrometer
Automotive engineering | 1991
|