Effect of nitrogen doping on microdefects and minority charge carrier lifetime of high-purity, dislocation-free and multicrystalline silicon
1996
Article (Journal)
English
Recovery of minority carrier lifetime in low-cost multicrystalline silicon
Online Contents | 2002
|Minority-carrier trapping in Ga-doped multicrystalline Si wafers
Online Contents | 2006
|Origin of the low carrier lifetime edge zone in multicrystalline PV silicon
Online Contents | 2009
|