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    Title :

    Radiation Effects in State-of-the Art CMOS Image Sensors


    Contributors:
    A. Antonsanti (author) / C. Virmontois (author) / V. Goiffon (author) / A. Le Roch (author) / L. D. Ryde (author) / J.-M. Lauenstein (author)

    Conference:

    Young Researchers Days JC^2 ; 2023 ; Toulouse, FR


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English





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