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    Title :

    Interpreting Archival Cross-Section vs. LET Fit Parameters Based On Data Quality


    Contributors:
    Ray Ladbury (author)

    Conference:

    SEE-MAPLD Single Event Effects (SEE) Symposium/Military and Aerospace Programmable Logic Devices (MAPLD) Workshop ; 2022 ; La Jolla (San Diego), CA, US


    Publication date :

    2022-05-18


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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