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    Title :

    The Imaging X-Ray Polarimetry Explorer (IXPE): Technical Overview II


    Contributors:

    Conference:

    SPIE Optical Engineering + Applications ; 2019 ; San Diego, CA, United States


    Publication date :

    2019-08-11


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English