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    Title :

    Analysis of Accelerated Life Test for BME Capacitors


    Contributors:

    Conference:

    Microelectronics Reliability and Qualification Working Meeting ; 2013 ; El Segundo, CA, United States


    Publication date :

    2013-12-10


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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