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    Title :

    Challenges for Radiation Hardness Assurance (RHA) on Power MOSFETs


    Contributors:

    Conference:

    NASA Electronic Parts and Packaging Program (NEPP) Electronics Technology Workshop (ETW) ; 2012 ; Greenbelt, MD, United States


    Publication date :

    2012-06-11


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English