This paper provides a discussion of the subject and an approach to establish a reliability and qualification methodology to facilitate the utilization of state-of-the-art advanced microelectronic devices and structures in high reliability applications.


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    Title :

    Reliability and qualification of advanced microelectronics for space applications


    Contributors:
    Kayali, S. (author)

    Conference:

    CANEUS Workshop on Micro-Nano Technology for Aerospace Applications


    Publication date :

    2003-01-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English