It was attempted to assess the reliability of DRAMs at the package level.


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    Title :

    Assesment of DRAM Reliability from Retention Time Measurements


    Contributors:
    Lieneweg, U. (author) / Nguyen, D. (author) / Blaes, B. (author)

    Conference:

    Microelectronics Reliability and Qualification


    Publication date :

    1998-06-16


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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