Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Latchup Test Consideration for Analog-to-Digital Converter


    Contributors:
    Johnston, A. (author) / Miyahira, T. (author)

    Conference:

    Single Event Effects Symposium


    Publication date :

    2000-04-13


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




    Latchup in CMOS Integrated Circuits

    Soliman, K. A. / Nichols, D. K. | NTRS | 1985


    Latent damage from single-event latchup

    Becker, H. N. / Miyahira, T. F. / Johnston, A. H. | NTRS | 2002



    Programmable Analog-To-Digital Converter

    Kist, Edward H., Jr. | NTRS | 1993


    Pseudolog Digital-to-Analog Converter

    Gooder, S. T. | NTRS | 1986