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    Title :

    Latchup Test Consideration for Analog-to-Digital Converter


    Contributors:
    Johnston, A. (author) / Miyahira, T. (author)

    Conference:

    Single Event Effects Symposium


    Publication date :

    2000-04-13


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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