Computed rates of SEU's more accurate. Exact integral chord-length distribution derived for use in calculations of rates of single-event upsets (SEU's) (changes in logic states) caused by impingement of cosmic rays or other ionizing radiation on electronic logic circuits.


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    Title :

    Exact Chord-Length Distribution For SEU Calculations


    Contributors:

    Published in:

    Publication date :

    1990-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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