Memory system for computer repeatedly tests itself during brief, regular interruptions of normal processing of data. Detects and corrects transient faults as single-event upsets (changes in bits due to ionizing radiation) within milliseconds after occuring. Self-testing concept surpasses conventional by actively flushing latent defects out of memory and attempting to correct before accumulating beyond capacity for self-correction or detection. Cost of improvement modest increase in complexity of circuitry and operating time.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Self-Testing Computer Memory


    Contributors:

    Published in:

    Publication date :

    1988-11-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Self-Testing Static Random-Access Memory

    Chau, Savio / Rennels, David | NTRS | 1991



    AUTOMATED SELF-TESTING

    SELWA ALEXANDER DAVID / CUTLER MARK JOHNSON | European Patent Office | 2022

    Free access

    AUTOMATED SELF-TESTING

    SELWA ALEXANDER DAVID / CUTLER MARK JOHNSON | European Patent Office | 2019

    Free access

    Automated self-testing

    SELWA ALEXANDER DAVID / CUTLER MARK JOHNSON | European Patent Office | 2020

    Free access