Microcomputer-controlled system speeds up measurements of Hall voltage, Seebeck coefficient, and thermal diffusivity in semiconductor compounds for thermoelectric-generator applications. With microcomputer system, large data base of these parameters gathered over wide temperature range. Microcomputer increases measurement accuracy, improves operator productivity, and reduces test time.
Measuring Thermoelectric Properties Automatically
NASA Tech Briefs ; 9 , 4
1986-03-01
Miscellaneous
No indication
English
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