Microcomputer-controlled system speeds up measurements of Hall voltage, Seebeck coefficient, and thermal diffusivity in semiconductor compounds for thermoelectric-generator applications. With microcomputer system, large data base of these parameters gathered over wide temperature range. Microcomputer increases measurement accuracy, improves operator productivity, and reduces test time.


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    Title :

    Measuring Thermoelectric Properties Automatically


    Contributors:
    Chmielewski, A. (author) / Wood, C. (author)

    Published in:

    Publication date :

    1986-03-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


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