The numerical modeling, instrumentation, identification, and procedures to characterize and/or control contamination hazards to equipment used on the Shuttle are discussed. On-orbit pollutants include molecular offgassing and outgassing, particulate material, and substances from thrusters, vents, and leaks. Clean-rooms are being implemented in ground assembly and integration facilities. Attention is given to an upgraded SPACE program for numerically modeling contamination pathways and appropriate procedures to protect instrumentation from film and particulate deposition. Finally, attention is given to military cryogenic IR detectors being employed to quantify the Shuttle thermal and solid pollutant environment on-orbit as a prelude to future operational IR sensors.
Shuttle optical environment; Proceedings of the Meeting, Washington, DC, April 23, 24, 1981
Shuttle optical environment ; 1981 ; Washington, DC
1982-01-01
Miscellaneous
No indication
English
Shuttle optical environment, conf. proc., April, 23-24, 1981, Washington, USA
Tema Archive | 1982
Shuttle optical environment : proceedings
TIBKAT | 1981
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