Fast computer-controlled sampling of optical knife-edge response (KER) signal increases accuracy of optical system aberration measurement. Submicrosecond-response detectors in optical focal plane convert optical signals to electrical signals converted to digital data, sampled and feed into computer for storage and subsequent analysis. Optical data are virtually free of effects of index-of-refraction gradients.
Submillisecond Optical Knife-Edge Testing
NASA Tech Briefs ; 7 , 3
1983-08-01
Miscellaneous
No indication
English
Lunar limb knife-edge optical transfer function measurements
British Library Online Contents | 1999
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Engineering Index Backfile | 1917
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Knife-edge seal for vacuum bagging
NTRS | 1980
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