Diodes manyfactured by Texas Instruments and Siemens performed well in group I testing. Failure analysis shows that group II testing is most detrimental to both sample lots. Same failure mode of excessive I(sub) R leakage can be clearly seen in group III testing.


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    Title :

    JANTX/N759A voltage regulating diode


    Published in:

    Publication date :

    1980-06-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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