Diodes manyfactured by Texas Instruments and Siemens performed well in group I testing. Failure analysis shows that group II testing is most detrimental to both sample lots. Same failure mode of excessive I(sub) R leakage can be clearly seen in group III testing.
JANTX/N759A voltage regulating diode
NASA Tech Briefs ; 4 , 4
1980-06-01
Miscellaneous
No indication
English
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