Automatic Monitoring System for time-dependent dielectric breakdown tests ninety-nine metal-oxide semiconductor capacitors simultaneously. Each breakdown generates voltage spike registered on readouts and indicated by LED. Latching circuit prevents recording of possible subsequent breakdowns in same capacitor. In addition to research use, system could also be adapted for quality control.
Record dielectric breakdown automatically
NASA Tech Briefs ; 2 , 2
1977-09-01
Miscellaneous
No indication
English
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